Semiconductor device having PLL-circuit

ABSTRACT

A semiconductor device includes a clock input terminal to which external clocks are supplied; a PLL circuit, which is supplied with the external clocks and generate first internal clocks; a logic circuit, which operates in synchronization with the internal clocks; and an internal counter, which counts the first internal clocks when the PLL circuit is tested. The internal counter is provided with an output terminal from which an output signal thereof is supplied to an external circuit.

CROSS REFERENCE TO RELATED APPLICATION

This application claims the priority of Application No. 2001-361961,filed Nov. 28, 2001 in Japan, the subject matter of which isincorporated herein by reference.

TECHNICAL FIELD OF THE INVENTION

The present invention relates generally to a semiconductor integratedcircuit including a PLL (Phase Locked Loop) circuit therein. Moreparticularly, the present invention relates to a method of jittermeasurement of a PLL circuit contained in a semiconductor integratedcircuit.

BACKGROUND OF THE INVENTION

A conventional IC includes a PLL circuit, an external clock terminal,buffer circuits, a test terminal and a logic circuit. The logic circuitis provided with input terminals and output terminals. The PLL circuitgenerates master clocks based on the external clocks. The logic circuitperforms a predetermined logical operation to an input signal, suppliedto the input terminals, in synchronization with the master clocksignals. Results of the logical operation by the logic circuit areoutputted from the output terminals.

When a test is performed to the PLL circuit, an external logic analyzeris connected to the clock terminal and the test output terminal. Intest, external clocks are supplied to the clock terminal, and outputclocks supplied from the test terminal are used to detect or measure thefrequency and jitter of the master clock signal. In accordance with suchdetection results, the PLL circuit is determined whether it has requiredcharacteristics.

“Jitter” is abrupt or spurious variations in the phase of the frequencymodulation of successive pulse reference to the phase of a continuousoscillator.

According to the above-described semiconductor IC, however, detectedwaveforms may become dull due to an impedance of a cable connected tothe terminals and to the external analyzer. As a result, it is difficultto detect or measure the frequency and jitter of the PLL circuitreliably.

OBJECTS OF THE INVENTION

Accordingly, it is an object of the present invention to provide asemiconductor device in which the frequency and jitter of a PLL can beanalyzed reliably.

Additional objects, advantages and novel features of the presentinvention will be set forth in part in the description that follows, andin part will become apparent to those skilled in the art uponexamination of the following or may be learned by practice of theinvention. The objects and advantages of the invention may be realizedand attained by means of the instrumentalities and combinationsparticularly pointed out in the appended claims.

SUMMARY OF THE INVENTION

According to a first aspect of the present invention, a semiconductordevice, includes a clock input terminal to which external clocks aresupplied; a PLL circuit, which is supplied with the external clocks andgenerate first internal clocks; a logic circuit, which operates insynchronization with the internal clocks; and an internal counter, whichcounts the first internal clocks when the PLL circuit is tested. Theinternal counter is provided with an output terminal from which anoutput signal thereof is supplied to an external circuit.

According to a second aspect of the present invention, a semiconductordevice, includes a clock input terminal to which external clocks aresupplied; a PLL circuit, which is supplied with the external clocks andgenerate first internal clocks; a logic circuit, which operates insynchronization with the internal clocks; a test clock terminal to whichtest clocks are supplied from an external circuit, the test clock havinga frequency with a predetermined phase difference from the externalclocks; a flip-flop circuit, which is supplied with the test clocks andthe first internal clocks to generate second internal clocks; and aninternal counter, which counts the second internal clocks when the PLLcircuit is tested. The internal counter is provided with an outputterminal from which an output signal thereof is supplied to an externalcircuit.

According to a third aspect of the present invention, a semiconductordevice, includes a clock input terminal to which external clocks aresupplied; a PLL circuit, which is supplied with the external clocks andgenerate first internal clocks; a logic circuit, which operates insynchronization with the internal clocks; a test clock terminal to whichtest clocks are supplied from an external circuit, the test clock havinga frequency with a predetermined phase difference from the externalclocks; a flip-flop circuit, which is supplied with the test clocks andthe first internal clocks to generate second internal clocks; aninternal counter, which counts the second internal clocks when the PLLcircuit is tested; and a selector, which selectively transfer one of thefirst clocks and the second clocks to the counter. The internal counteris provided with an output terminal from which an output signal thereofis supplied to an external circuit.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram illustrating a conventional semiconductorintegrated circuit.

FIG. 2 is a block diagram illustrating a semiconductor integratedcircuit according to a first preferred embodiment of the presentinvention.

FIG. 3 is a block diagram illustrating a semiconductor integratedcircuit according to a second preferred embodiment of the presentinvention.

FIG. 4 is a timing chart showing the operation of the second preferredembodiment.

FIG. 5 is a graph showing the operation of the second preferredembodiment.

FIG. 6 is a block diagram illustrating a semiconductor integratedcircuit according to a third preferred embodiment of the presentinvention.

DETAILED DISCLOSURE OF THE INVENTION

In the following detailed description of the preferred embodiments,reference is made to the accompanying drawings which form a part hereof,and in which is shown by way of illustration specific preferredembodiments in which the inventions may be practiced. These preferredembodiments are described in sufficient detail to enable those skilledin the art to practice the invention, and it is to be understood thatother preferred embodiments may be utilized and that logical, mechanicaland electrical changes may be made without departing from the spirit andscope of the present inventions. The following detailed description is,therefore, not to be taken in a limiting sense, and scope of the presentinventions is defined only by the appended claims.

For better understanding of the present invention, a conventionaltechnology is first described. FIG. 1 shows a block diagram showing aconventional IC, which includes a PLL circuit 10, an external clockterminal 11, buffer circuits 16 and 17, a test terminal 18 and a logiccircuit 20. The logic circuit 20 is provided with input terminals 21 andoutput terminals 22.

The PLL circuit 10 includes a phase comparator 12, a low-pass filter 13,a voltage-controlled oscillator 14 and a frequency divider (frequencydemultiplier) 15. Two of input terminals of the phase comparator 12 areconnected to the external clock terminal 11 and an output terminal ofthe frequency divider 15. An output terminal of the frequency comparator12 is connected to an input terminal of the low-pass filter 13. Anoutput terminal of the low-pass filter 13 is coupled to an inputterminal of the voltage-controlled oscillator 14. An output terminal ofthe voltage-controlled oscillator 14 is coupled to an input terminal ofthe frequency divider 15, an input terminal of the buffer 16 and aninput terminal of the buffer 17. In the PLL 10, the external clocks ECKare multiplied in frequency by N to generate master clock signals MCK.

The voltage-controlled oscillator 14 generates the master clock signalsMCK in accordance with a control voltage supplied from the low-passfilter 13. An output signal of the voltage-controlled oscillator 14 isdivided in frequency to be 1/N to generate the master clock signal MCK.The phase comparator 12 compares the phases of the external clock ECKand the master clock MCK to provide an output signal corresponding tothe phase difference between those clocks ECK and MCK. A higherfrequency element is removed from the output signal of the phasecomparator 12 to provide a control voltage, to be supplied to thevoltage-controlled oscillator 14.

The above-described feed-back operation is repeated, so that thefrequency of the mater clock MCK is precisely matched to the “N” timesof the external clock ECK.

The master clocks MCK are supplied through the buffer 16 to the logiccircuit 20. The logic circuit 20 performs a predetermined logicaloperation to an input signal, supplied to the input terminals 21, insynchronization with the master clock signals MCK. Results of thelogical operation by the logic circuit 20 are outputted from the outputterminals 22.

An output signal of the voltage-controlled oscillator 14 is suppliedthrough the buffer 17 to the test output terminals 18. When a test isperformed to the PLL circuit 10, an external logic analyzer is connectedto the clock terminal 11 and the test output terminal 18. In test,external clocks ECK are supplied to the clock terminal 11, and outputclocks (MCK) supplied from the test terminal 18 are used to detect ormeasure the frequency and jitter of the master clock signal MCK. Inaccordance with such detection results, the PLL circuit 10 is determinedwhether it has required characteristics.

According to the above-described semiconductor IC, however, detectedwaveforms may become dull due to an impedance of a cable connected tothe terminals 11 and 18 and to the external analyzer (not shown). As aresult, it is difficult to detect or measure the frequency and jitter ofthe PLL circuit reliably.

FIG. 2 is a block diagram illustrating a semiconductor integratedcircuit according to a first preferred embodiment of the presentinvention. In FIG. 2, the same and corresponding components to those inFIG. 1 are represented by the same reference numerals.

The semiconductor IC includes a PLL circuit 10, an external clockterminal 11, buffer circuits 16 and 31, a logic circuit 20, a controlterminal 33, an AND gate 32, an internal counter 34, a reset terminal 35and test output terminals 36. The logic circuit 20 is provided withinput terminals 21 and output terminals 22.

The PLL circuit 10 includes a phase comparator 12, a low-pass filter 13,a voltage-controlled oscillator 14 and a frequency divider (frequencydemultiplier) 15. Two of input terminals of the phase comparator 12 areconnected to the external clock terminal 11 and an output terminal ofthe frequency divider 15. An output terminal of the frequency comparator12 is connected to an input terminal of the low-pass filter 13. Anoutput terminal of the low-pass filter 13 is coupled to an inputterminal of the voltage-controlled oscillator 14. An output terminal ofthe voltage-controlled oscillator 14 is coupled to an input terminal ofthe frequency divider 15, an input terminal of the buffer 16 and aninput terminal of the buffer 31. In the PLL 10, the external clocks ECKare multiplied in frequency by N to generate master clock signals MCK.

The voltage-controlled oscillator 14 generates the master clock signalsMCK in accordance with a control voltage supplied from the low-passfilter 13. An output signal of the voltage-controlled oscillator 14 isdivided in frequency to be 1/N to generate the master clock signal MCK.The phase comparator 12 compares the phases of the external clock ECKand the master clock MCK to provide an output signal corresponding tothe phase difference between those clocks ECK and MCK. A higherfrequency element is removed from the output signal of the phasecomparator 12 to provide a control voltage, to be supplied to thevoltage-controlled oscillator 14.

The above-described feed-back operation is repeated, so that thefrequency of the mater clock MCK is precisely matched to the “N” timesof the external clock ECK.

The master clocks MCK are supplied through the buffer 16 to the logiccircuit 20. The logic circuit 20 performs a predetermined logicaloperation to an input signal, supplied to the input terminals 21, insynchronization with the master clock signals MCK. Results of thelogical operation by the logic circuit 20 are outputted from the outputterminals 22.

An output terminal of the buffer 31 is connected to an input terminal ofthe AND gate 32. The other input terminal of the AND gate is connectedto the control gate 33, to which an enable signal EN is supplied. Anoutput terminal of the AND gate 32 is connected to a clock terminal “C”of the internal counter 34. A reset terminal of the internal counter 34is connected to the reset terminal 35, to which a reset signal RST issupplied.

The counter 34 is reset to “0” when a high level “H” of the reset signalRST is supplied to the reset terminal “R”. The counter 34 counts thenumber of pulse signals supplied to the clock terminal “C” one by one,when a low level “L” of the reset signal RST is supplied to the resetterminal “R”. A count value of the internal counter 34 is outputted fromthe test output terminals 36. The count value is a binary digit.

Next, the operation for measuring the frequency of the master clocksignal MCK will be described. First, the clock terminal 11, the controlterminal 33, the reset terminal 35 and the test output terminals 36 areconnected to an external logic tester, which is not shown. When thetester supplies an external clock ECK to the clock terminal 11, the PLLcircuit 10 starts operating. At this time, the control terminal 33 issupplied with a low level “L” of the enable signal EN and the resetterminal 35 is supplied with a high level “H” of the reset signal RST.The internal counter 34 is reset to zero. A low level signal “L” issupplied to the clock terminal “C”, so that the internal counter 34 doesnot operate.

Next, the reset signal RST is turned to “L”, so that the internalcounter 34 is able to start counting. After that, the enable signal ENis turned to “H” in synchronization with the external clock signal ECKduring “M” cycles of the external clock signal ECK. The master clocksignal MCK is supplied through the AND gate 32 to the clock terminal “Cof the counter 34.

When the external clock signal ECK has spent “M” cycles and the enablesignal EN is turned to “L”, a counted value at the test output terminal36 is detected. When the counted value is “N×M”, the PLL circuit 10 isjudged it is operating normally.

According to the above-described first preferred embodiment, the counter34 counting the master clock signal MCK is equipped in the semiconductordevice, so that it is not required to output the master clock signal MCKto an external circuit when a test of the PLL circuit 10 is carried out.Therefore, the oscillating frequency of the PLL circuit 10 can bemeasured or analyzed precisely and reliably.

FIG. 3 is a block diagram illustrating a semiconductor integratedcircuit according to a second preferred embodiment of the presentinvention. In FIG. 3, the same and corresponding components to those inFIGS. 1 and 2 are represented by the same reference numerals. Thesemiconductor IC according to this embodiment includes a circuit formeasuring jitter of a PLL circuit.

The semiconductor IC includes a PLL circuit 10, an external clockterminal 11, buffer circuits 16 and 31, a logic circuit 20, a test clockterminal 37, an AND gate 40, an internal counter 34, a reset terminal35, test output terminals 36, a flip-flop circuit 38 and an inverter 39.The logic circuit 20 is provided with input terminals 21 and outputterminals 22.

The PLL circuit 10 generates master clock signal MCK based on anexternal clock signal ECK, in the same manner as the first preferredembodiment. The master clocks MCK are supplied through the buffer 16 tothe logic circuit 20. The logic circuit 20 performs a predeterminedlogical operation to an input signal, supplied to the input terminals21, in synchronization with the master clock signals MCK. Results of thelogical operation by the logic circuit 20 are outputted from the outputterminals 22.

An output terminal of the buffer 31 is connected to a data terminal “D”of the flip-flop circuit 38. The test clock terminal 37 is connected toa clock terminal “C” of the flip-flop circuit 38 and an input terminalof the inverter 39. Two of input terminals of the AND gate 40 areconnected to an output terminal “Q” of the flip-flop circuit 38 and toan output terminal of the inverter 39. An output terminal of the ANDgate 40 is connected to a clock terminal “C” of the internal counter 34.A reset terminal of the internal counter 34 is connected to the resetterminal 35, to which a reset signal RST is supplied.

The counter 34 is reset to “0” when a high level “H” of the reset signalRST is supplied to the reset terminal “R”. The counter 34 counts thenumber of pulse signals supplied to the clock terminal “C” one by one,when a low level “L” of the reset signal RST is supplied to the resetterminal “R”. A count value of the internal counter 34 is outputted fromthe test output terminals 36. The count value is a binary digit.

The test clock terminal 37 is supplied with a test clock signal TCK,having a predetermined phase difference from the external clock signalECK, from an external tester circuit.

The flip-flop circuit 38 holds a signal at the data terminal “D” andoutputs it from the output terminal “Q”, when the test clock signal TCKsupplied to the clock terminal “C” is turned to high or rising up.

FIG. 4 is a timing chart showing the operation of the second preferredembodiment. FIG. 5 is a graph showing the operation of the secondpreferred embodiment. For easy understanding it assumed that theexternal clock signal ECK and the master clock signal MCK havefrequencies of 1 MHz and 4 MHz, respectively.

In operation of jitter measurement, first, the clock terminal 11, thetest clock terminal 37, the reset terminal 35 and the test outputterminals 36 are connected to an external logic tester, which is notshown. When the tester supplies an external clock ECK of 1 MHz to theclock terminal 11, the PLL circuit 10 starts operating. At this time,the test clock terminal 37 is supplied with a low level “L” of the testclock signal TCK. The reset terminal 35 is supplied with a high level“H” of the reset signal RST. The internal counter 34 is reset to zero.

Next, the reset signal RST is turned to “L”, so that the internalcounter 34 is able to start counting. After that, for example, athousand of pulses of the test clock signal TCKi (i=0 to “n”, “n” may betwo-hundred and forty-nine) are inputted continuously in synchronizationwith the external clock signal ECK. The test clock signal TCKi has adelay time of i(ns) from the external clock signal ECK. The test clocksignal TCK1 may be 1 MHz as well as the external clock signal ECK,although it is 4 MHz in FIG. 4.

When the test clock signal TCKi is turned to high, the current status ofthe master clock signal MCK, “H” or “L”, is held by the flip-flopcircuit 38, and is supplied to the input terminal of the AND gate 40. Atthis time, the inverter 39 outputs a low level “L” of signal, so thatthe AND gate 40 outputs a “L” level of signal.

When the test clock signal TCKi is turned to low, the output of theinverter 39 is turned to “H”. Therefore, if a high level “H” of themaster clock signal MCK is held by the flip-flop circuit 38, the ANDgate 40 would supplies an output signal of “H”. The internal counter 34counts up one. On the other hand, if a low level “L” of the master clocksignal MCK is held by the flip-flop circuit 38, the AND gate 40 wouldsupplies an output signal of “L”. The count value of the internalcounter 34 does not change.

After a thousand of pulses of the test clock signal TCKi are entered,the count value of the internal counter 34 is read out and recorded.Based on such a count value, a probability in which the master clocksignal MCK is high “H” after a period of i(ns) since the external clocksignal Eck is turned to high is calculated.

The above operation is repeated 250 times while the delay time of thetest clock signal TCKi is changed 0 ns to 249 ns. In FIG. 5, ahorizontal axis indicates the delay time of the test clock signal TCKi,and a vertical axis indicates count values of the internal counter 34. Arange of jitter of the PLL circuit 10 is indicated by an intermediatevalue between count values of 0 to 1000. In FIG. 5, a solid line “Xindicates a case of smaller jitter, while a dashed line “Y” indicates acase of larger jitter.

According to the above-described second preferred embodiment, thecounter 34 counting the test clock signal TCK is equipped inside thesemiconductor device, so that it is not required to output the masterclock signal MCK to an external circuit when a jitter test of the PLLcircuit 10 is carried out. Therefore, the jitter of the PLL circuit 10can be measured or analyzed precisely and reliably.

FIG. 6 is a block diagram illustrating a semiconductor integratedcircuit according to a third preferred embodiment of the presentinvention. In FIG. 6, the same and corresponding components to those inFIGS. 1, 2 and 3 are represented by the same reference numerals. Thesemiconductor IC according to this embodiment includes a circuit formeasuring both of oscillating frequency and jitter of a PLL circuit.

The semiconductor IC includes a PLL circuit 10, an external clockterminal 11, buffer circuits 16 and 31, a logic circuit 20, a test clockterminal 37, an AND gates 32 and 40, a control terminal 33, an internalcounter 34, a reset terminal 35, test output terminals 36, a flip-flopcircuit 38, an inverter 39, a selector 41 and a mode selecting terminal42. The logic circuit 20 is provided with input terminals 21 and outputterminals 22.

The PLL circuit 10 generates master clock signal MCK based on anexternal clock signal ECK, in the same manner as the first preferredembodiment. The master clocks MCK are supplied through the buffer 16 tothe logic circuit 20. The logic circuit 20 performs a predeterminedlogical operation to an input signal, supplied to the input terminals21, in synchronization with the master clock signals MCK. Results of thelogical operation by the logic circuit 20 are outputted from the outputterminals 22.

An output terminal of the buffer 31 is connected to a data terminal “D”of the flip-flop circuit 38 and to an input terminal of the AND gate 32.Another input terminal of the AND gate 32 is connected to the controlterminal 33. The test clock terminal 37 is connected to a clock terminal“C” of the flip-flop circuit 38 and an input terminal of the inverter39. Two of input terminals of the AND gate 40 are connected to an outputterminal “Q” of the flip-flop circuit 38 and to an output terminal ofthe inverter 39. Output terminals of the AND gates 23 and 40 areconnected input terminals “A” and “B” of the selector 41. An outputterminal of the selector 41 is connected to a clock terminal “C” of theinternal counter 34. A reset terminal of the internal counter 34 isconnected to the reset terminal 35, to which a reset signal RST issupplied.

The selector 41 selects one of the input terminals “A” and “B” totransmit to the counter 34 in accordance with a mode selection signalMOD, supplied to the mode selecting terminal 42. When the selector 41selects the input terminal “A”, a frequency test of the PLL circuit 10is carried out in the same manner as the first preferred embodiment. Onthe other hand, when the selector 41 selects the input terminal “B”, ajitter test of the PLL circuit 10 is carried out in the same manner asthe second preferred embodiment.

According to the third preferred embodiment, the internal counter 34 isused both for a frequency test and a jitter test of the PLL circuit 10,so that those test can be carried out precisely without increasing thesize of circuitry.

The present invention is not limited by the above-described embodimentsas follows:

-   -   a) The structure of a PLL circuit is not limited by that shown        in FIG. 2.    -   b) Reverse logic can be applied to signals such as the enable        signal EN and the reset signal RST.    -   c) The multiplying factor of the PLL circuit 10 can be other        than “N”.    -   d) Although in FIGS. 3 and 5, the number of the master clock        signal MCK at high level “H” is counted at a timing when the        test clock signal TCK is turned to high, the number of the        master clock signal MCK at high level “H” may be counted at a        timing when the test clock signal TCK is turned to low. Further,        the number of the master clock signal MCK at high low level “L”        may be counted instead of “H”.    -   e) In FIG. 4, the delay time of the test clock signal TCKi and        number of cycle may be changed.    -   f) In FIGS. 2, 3 and 5, input and output terminals for use of        test and input and output terminals for normal operation are        independently provided. However, those input and output        terminals may be used both for test and normal operation.

1-4. (canceled)
 5. A semiconductor device, comprising: a clock inputterminal to which external clocks are supplied; a PLL circuit, which issupplied with the external clocks and generate first internal clocks; alogic circuit, which operates in synchronization with the internalclocks; a test clock terminal to which test clocks are supplied from anexternal circuit, the test clock having a frequency with a predeterminedphase difference from the external clocks; a flip-flop circuit, which issupplied with the test clocks and the first internal clocks to generatesecond internal clocks; an internal counter, which counts the secondinternal clocks when the PLL circuit is tested; and a selector, whichselectively transfer one of the first clocks and the second clocks tothe counter, wherein the internal counter is provided with an outputterminal from which an output signal thereof is supplied to an externalcircuit.
 6. A semiconductor device according to claim 5, furthercomprising: a control terminal to which a control signal is suppliedfrom an external circuit when a frequency test is started; a first logicgate, which is supplied with the first internal clocks and the controlsignal; and a reset terminal to which a reset signal is supplied from anexternal circuit to the counter, and a second logic gate, which issupplied with the second internal clocks and the test clocks; whereinthe counter operates in accordance with an output signal of the selectorand the reset signal.